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STM8S105C6T6 STM32L476RCT6

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STM8S105C6T6 STM32L476RCT6

STM8S105C6T6  STM32L476RCT6
  • STM8S105C6T6  STM32L476RCT6缩略图1
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STM8S105C6T6 STM32L476RCT6产品详情

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  • STM32L476RCT6:STM32L476RCT6
  • 品牌:ST/意法半导体
  • 封装形式:DIP
  • 类型:数字集成电路
  • 用途:军工
  • 功能:单片机
  • 导电类型:双极型
  • 封装外形:金属壳圆形型
  • 集成度:小规模(<50)
  • 型号:STM32L476RCT6
  • 批号:2017+
GPIOs (general-pur*e inputs/outputs)
Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIO pins are shared with digital or analog alternate functi*. All GPIOs are high-current-
capable except for analog inputs.
The I/Os alternate function configuration can be locked if needed following a specific
sequence in order to *oid spurious writing to the I/Os registers.
I/Os on APB2 with up to 18 MHz to*ling speed
2.3.22
ADC (analog-to-digital converter)
Two 12-bit analog-to-digital converters are embedded i* STM32F103xx performance line
devices and each ADC shares up to 16 external channels, performing conversi* in single-
shot or scan modes. In scan mode, automatic conversion is performed on a selected group
of analog inputs.
Additional logic functi* embedded in the ADC interface allow:
Simultaneous sample and hold
Interle*ed sample and hold
Single shunt
The ADC can be served by the DMA co*oller.
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all selected channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-pur*e timers (TIMx) and the advanced-co*ol timer
(TIM1) can be internally connected to the ADC start tri*er, injectio*i*er, and DMA
tri*er respectively, to allow the applicatio*synchronize A/D conversion and timers.
2.3.23
Temperature sensor
The temperature sensor has to generate*oltage that varies linearly with temperature. The
conversion range is between 2 V < VDDA < 3.6 V. The temperature sensor is internally
connected to the ADC12_IN16 input channel which is used to convert the sensor output
voltagdigital value.
2.3.24
Serial wire JTAG debug port (SWJ-DP)
The ARM SWJ-DP Interface is embedded. and is a combined JTAG and serial wire debug
port that enables either a serial wire debug or a JTAG probe to be connected to the target.
The JTAG TMS and TCK pins are shared with SWDIO and SWCLK, respectively, and a
specific sequence on the TMS pin is used to switch between JTAG-DP and SW-DP.
以上内容为STM8S105C6T6 STM32L476RCT6,本产品由深圳市斯瑞特科技有限公司直销供应。
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